#1 Le 02/10/2013, à 11:44
- Shinji-san
[Résolu] S.M.A.R.T. Throughput_Performance en chutte libre
Bonjour,
J'ai lancé smartcl hier et aujourd'hui sur un disque de mon serveur :
Hier:
[11:56:09] root@serveur:~# smartctl -a /dev/sdb
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-48-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint F3
Device Model: SAMSUNG HD103SJ
Serial Number: S246J90Z313010
LU WWN Device Id: 5 0024e9 202186a65
Firmware Version: 1AJ10001
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Tue Oct 1 11:56:32 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9360) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 156) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 071 069 025 Pre-fail Always - 8903
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 550
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 7363
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 1
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 550
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 22
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 055 050 000 Old_age Always - 45 (Min/Max 10/50)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 10
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 1
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 551
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.J'ai fait un test court et un test long puis aujourd’hui j'ai relancé la commande dont voici le résultat :
[10:26:44] root@serveur:~# smartctl -a /dev/sdb
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-48-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint F3
Device Model: SAMSUNG HD103SJ
Serial Number: S246J90Z313010
LU WWN Device Id: 5 0024e9 202186a65
Firmware Version: 1AJ10001
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Wed Oct 2 11:02:53 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9360) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 156) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 056 056 000 Old_age Always - 8524
3 Spin_Up_Time 0x0023 071 069 025 Pre-fail Always - 8903
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 550
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 7386
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 1
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 550
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 22
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 055 049 000 Old_age Always - 45 (Min/Max 10/51)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 10
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 1
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 551
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 7365 -
# 2 Short offline Completed without error 00% 7363 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.Seulement, une valeur à drastiquement chuter depuis hier : Throughput_Performance.
Hier :
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0Aujourd'hui :
2 Throughput_Performance 0x0026 056 056 000 Old_age Always - 8524Dois-je m'inquiéter ?
Dernière modification par Shinji-san (Le 02/10/2013, à 15:46)
Hors ligne
#2 Le 02/10/2013, à 14:23
- serged
Re : [Résolu] S.M.A.R.T. Throughput_Performance en chutte libre
D'après Wikipédia :
ouikipédia a écrit :
Performance générale en sortie du disque. Si la valeur de l’attribut diminue, alors la probabilité d’avoir un problème avec le disque augmente.
Donc c'est bon ! Il s'est amélioré !
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#3 Le 02/10/2013, à 15:45
- Shinji-san
Re : [Résolu] S.M.A.R.T. Throughput_Performance en chutte libre
Ah bah j'avais lu wiki à l'envers 
Je te remercie d'avoir pris le temps de me répondre et je clôture 
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